Sensofar prepared a premium event to show you the two new heads from the ...
surface metrology measurements
All the articles in our blog about surface metrology measurements
Full field vibration mode shape and transient analysis
- Non-Scanning MEMS Analyzer
- Million-data-points vibration maps
- Picometer vibration resolution
- In- and out-of-plane up to 25Mhz...
Sensofar’s line of Integrable Heads is available
More than just a birthday, Sensofar has even more achievements to celebrate!
Sensofar Metrology, with over 20 years’ experience in developing optical surface metrology systems, is launching a new four-sensor...
Schaefer's technological offer, for scientists and researchers, also includes acoustic booths, with a very high degree of customization. We have already gained significant experience in the field, delivering several booths to clients in industrial and academic research. Each...
October 4-9, 2021 - The most awaited European meeting of the year for the manufacturing industry is taking place!
Sensofar ansd Schaefer will be there, featuring the latest systems!
All attendees who visit us will have the opportunity to see a live...
From Pioneer work in 1999...
Optics Letters (Vol. 24, No. 5) and Applied Optics (Vol. 38, No. 34)
The first simultaneous...
We're the distributors of Daeil Systems instruments. Daeil is a korean company that supplies a wide range of vibration isolation systems, including thousands of optical tables, from passive to active isolation systems. Customers are industries,...
Have a look at this case study: "Reducing Friction for Efficient Motion of Sliding Surfaces by Laser Surface Texturing".
Here below we summarize the main topics of this interesting article.
The problem: "Energy losses due to friction and wear of sliding surfaces...
Due to the complexity involving optical surface metrology, Sensofar has developed a poster-document that will help you understand all the points and steps to follow in the measurement process with the ...
Atomic force microscopy (AFM) is a particularly powerful technique for characterization of 2D materials including graphene and transition metal dichalcogenides like molybdenum disulfide (MoS2). AFM can easily measure not only topography but also electrical and mechanical...
ISO 25178 is considered one of the main milestones in the characterization of 3D areal surface texture. It is based on the principle that nature is inherently three-dimensional. Thus, it is the...
Wednesday, April 8th, 2020 - 10:00 AM to 11:00 AM CEST
Presented by: Carles Otero & Sandra de Pedro
Learn all about Sensofar’s new...
PROMOTION ENDED - All the instruments have been sold
We are selling two 3D optical profilometers (Sensofar S Neox and GBS Ilmenau Compact) and a very recently produced benchtop SEM (manufactured by the korean company Emcrafts). They have never been installed...
GBS ILmenau has exhibited their instruments at the Control Show in Stuttgart at the beginning of May. As many competitors they wanted to demonstrate their capabilities. Since not everyone had the opportunity to visit the exhibition we've picked up a few applications in the form of 3D scans....
Schaefer Italy is proud to announce the release by Sensofar Metrology of the 5th generation of its flagship optical profiler. The S neox is a high-performance non-contact 3D optical profiler microscope system purposely-designed for sub-nano, nano and micro-scale...
Schaefer Italy would like to invite you to the live session of the new version 6.4 release of the Sensofar software SensoSCAN.
In this version, you will find a lot of new features in the following sections: Inspection & Acquisition, Display & Analysis, Configuration &...
Sensofar Metrology has developed new innovative software features for their 3-in-1 S-line 3D surface metrology systems. Two new measurement technologies –Confocal Fusion & Continuous Confocal– represent significant new developments in 3D surface metrology, and underline Sensofar’s...
Surface Texture Measurement in 3D - Practical applications and guidelines for implementing ISO 25178.
We will review:
- The need for 3D texture analysis as compared with linear profiles.
- A basic description of the ISO parameters.
- The concept of...