SPM/AFM Control Systems & Measurement Options

We distribute SPM  & AFM Control Systems & Measurement options designed, manufactured and provided by RHK Technology and CSI Instruments.

RHK Technology has a long and proud history of accomplishment in SPM Control. With over 1,000 controllers installed around the world, RHK has brought a continual series of advanced capabilities to the nanotechnology field for decades. From the early days of STM, to contact AFM, then NC-AFM, through the transition to digital electronics, and on to new paradigms for graphical interface ease of use and total hardware integration, RHK control platforms consistently bring powerful new functionality to researchers worldwide.

CSInstruments began by providing the AFM accessories ResiScope, which allows the characterization of conductive surface. They currently offer new modes and controllers for a variety of applications in the field of nanoscience, materials, surface science, polymers, thin films, semiconductors, biomaterials, photovoltaics, conductive surface characterization.