Webinar - Broaden your Horizons with the New Sensofar System S wide

Sensofar S Wide - Large area 3D optical profilometer

Post publication date:

Friday, April 3, 2020

Wednesday, April 8th, 2020 - 10:00 AM to 11:00 AM CEST

Presented by: Carles Otero & Sandra de Pedro

Learn all about Sensofar’s new exceptional 3D Optical Profiler which expands metrology towards a larger field of view for surface roughness measurement. The S wide integrates the benefits of a digital microscope into a hi-res measuring instrument.

Key Topics:

This new system improve routine operation through ease of use, with one-shot height measurements up to 40 mm, without Z-scanning
Achievement of sub-micron height repeatability over entire extended area
Color acquisition with the best resolution thanks to the integrated 5Mpx camera
Form deviation from 3D CAD models for an effective integration to daily internal processes