Low Noise Conductive silicon probes
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The DPE probes feature silicon tips and a special structure of conductive layers, which provides a more stable electrical signal and less noise. However, some reduction in resolution for topography images is possible when using DPE probes due to the increased tip radius.
Pt coated resulting tip radius .................................. < 40 nm
Pt overall coating .................................. 50 nm
Technical Features
| Cantilever Series | Length l, ± 5 μm | Width w, ± 3 μm | Thickness ± 0.5 μm | Freq. Rison. kHz Typical | Freq. Rison. kHz Range | Const. Force N/m Typical | Const. Force N/m Range |
|---|---|---|---|---|---|---|---|
| HQ:DPE-XSC11 | |||||||
| HQ:DPE-XSC11 lever A | 500 | 30 | 2.7 | 15 | 12-18 | 0.2 | 0.1 - 0.4 |
| HQ:DPE-XSC11 lever B | 210 | 30 | 2.7 | 80 | 60 - 100 | 2.7 | 1.1 - 5.6 |
| HQ:DPE-XSC11 lever C | 150 | 30 | 2.7 | 155 | 115 - 200 | 7 | 3-16 |
| HQ:DPE-XSC11 lever D | 100 | 50 | 2.7 | 350 | 250 - 465 | 42 | 17 - 90 |