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ACCESS-NC Probes are sharp silicon probes designed to allow a direct optical view of the AFM tip when imaging. ACCESS-NC is designed for tapping/noncontact mode.
Technical Features
Cantilever Parameter | Nominal Value |
---|---|
Spring Constant (N/m) | 45 |
Frequency (kHz) | 300 |
Length (μm) | 160 |
Width (μm) | 54 |
Thickness (μm) | 5 |
ROC | <10 |
Tip Side Coating | None |
Reflex Side Coating | None |