Force Modulation - Tip View Probes - ACCESS-FM

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ACCESS-FM Probes are sharp silicon probes designed to allow a direct optical view of the AFM tip when imaging. ACCESS-FM are ideal for Force Modulation Mode.

Technical Features

Cantilever ParameterNominal Value
Spring Constant (N/m)3.8
Frequency (kHz)60
Length (μm)245
Width (μm)52
Thickness (μm)3
ROC (nm)<10
Tip Side CoatingNone
Reflex Side CoatingNone