Platinum-Iridium AFM probes with prolonged mechanical wear
The 25PtIr300B is the updated version of RMN’s most popular probe, with prolonged mechanical wear. This versatile probe is a good choice for many applications and can be used in various modes, including tapping and contact. These probes are ideal for C-AFM, SCM, SMM, SMIM, EFM and KPFM.
- Tip shank length: 80 μm (± 25%)
- Cantilever length: 300 µm (± 15%)
- Cantilever width: 100 µm (± 15%)
- Spring constant: 22 N/m (± 40%)
- Frequency: 21 kHz (± 30%)
- Standard tip radii below 20 nm
- Tip radii below 10 nm on request - 25PtIr300B-10
- Non - standard probe tips and cantilevers upon request
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Technical Features
Material: Solid platinum or platinum-iridium probe tip and cantilever supported on standard AFM probe sized ceramic chip, connected to conductive gold bonding pad with conductive epoxy. RMN also has probes available without gold contact pad, to help reduce stray capacitance.
Probes on standard sized substrates have a part number ending in the letter B (i.e. 25Pt300B).
Probes designed specifically for the Keysight (Agilent) Scanning Microwave Microscope (SMM) have the letter A rather than B (i.e. 12Pt400A).
Additional substrates:
- C - Substrate without gold bonding pad, to help reduce stray capacitance (= to A dimensions)
- D - Substrate has a 200um gold transmission line the entire length of the chip and the back is completely covered in gold (standard size chip)
- E - Substrate has the same features as the D substrate, only it is thinner (5 mil thick)