High Definiton Kelvin Force Microscopy - BIMODAL HD-KFM

Electric characterization with the atomic force microscope has an increasing demand among the AFM community to solve new research topics in nanotechnology like energy harvesting, polymer or organic based electronics, or new advances in the semiconductor industry.

The bimodal HD Kelvin Force Microscopy technique developed by CSI for the Nano-Observer AFM has the advantage of amplifying the feedback signal through the second eigenmode of the cantilever. Also it allows a much closer probe of the electric field created by the surface potential, compared to other approaches. This is of extreme relevance when imaging small molecules or bidimensional materials. Several applications of surface potential characterization with bimodal HD KFM are described in the application note, that you can download here below.