Schaefer News

Blog Post
Start doing DLS the right way!
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Event - Congress -Workshop

Friday, May 13, 2022 - 11:15 to 12:15
SICC course: How to improve and evaluate the cosmetic stability - LS Instruments DWS and X-Rite Color Spectrophotometry presentations
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Browse our Catalogue

Accessories AFM/SPM/STM/SEM/TEM
Accessories / Consumables / Software AFM, SPM, STM, SEM, Optical Profilers
Accessories/Consumables High Vacuum and Ultra High Vacuum (UHV)
Accessories / Consumables High Vacuum and Ultra High Vacuum (UHV)
Automated recognition systems
Automated recognition systems
Bio-nanoparticles
Bio-nanoparticles
Digital Microscopy
Instruments for Measurement and Control of Physical Quantities
Instruments for Measurement and Control of Physical Quantities
Laboratory Equipment
Laboratory Equipment
Microscopes for Nanoscale Imaging
Microscopes for Nanoscale Imaging
Nanoparticles Analysis
Nanoparticles Analysis
Physical and chemical analysis instruments
Physical and chemical analysis instruments
Profilometers - Objectives
Profilometers
Research Quality Nanoparticles
Research Quality Nanoparticles
Single Cell Analysis and Manipulation
Single Cell Analysis and Manipulation
Spin Coaters
Spin Coaters
Surface Mechanical Testers
Surface Mechanical Testers
Thin Films
Thin Films
Vibration Isolation Systems
Vibration Isolation Systems

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