AFM/SPM, SEM, Optical profilers Analysis Software

AFM/SPM, SEM, Optical profilers Analysis Software

Schaefer SEE distributes also nanoscale and microscale image processing software. The choosen partner is acknowledged as the market's leader: Digital Surf. MountainsSPIP® for Scanning Probe Microscopy is based on industry-standard Mountains® technology. It also includes all the best SPIP™ (Image Metrology) interactivity and analytical tools, MountainsSPIP® software contains the most advanced set of professional tools on the market for your scanning probe microscopy image analysis.

Apply interactive particle analysis - Analyze force curves and force volume images - Perform correlative analysis by combining SPM images and data from other instruments - Analyze multi-channel files - Process data from ANY scanning probe microscope including atomic force microscopes (AFM) - Correct, normalize and denoise measured data - Ensure correct XY calibration - Correct tip effect - Characterize surface texture in accordance with ISO standards

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