Schaefer's Blog

Into this section you can find new products, new partners, news on the nanotechnology fields, on the vacuum and flow measurement, and on other fields of interest of our and yours business.

Last News

Monday, June 22, 2020

Webinar - ISO 25178: Surface Texture Characterization

ISO 25178 is considered one of the main milestones in the characterization of 3D areal surface texture. It is based on the principle that nature is inherently three-dimensional. Thus, it is the...

Tuesday, June 9, 2020

Webinar 11th of June, 2020: Tribology, Measuring Surfaces Effectively

Thu, Jun 11, 2020 10:00 AM - 11:00 AM CEST
Thu, Jun 11, 2020 6:00 PM - 7:00 PM CEST

In this webinar you will expand your knowledge in roughness characterization by moving from contact stylus profile Ra analysis to Sa Optical areal analysis.
Wear...

Monday, May 18, 2020

Webinar/Virtual Symposium - 27/05/2020 - Applications of Atomic Force Microscopy in Virology Research

Wednesday, May 27th, 2020 from 8:00 AM - 10:00 AM PDT  (3:00 PM - 5:00 PM GMT)

An online virtual symposium sponsored by Oxford Instruments Asylum Research on Applications of Atomic Force Microscopy in Virology Research. The symposium will feature a panel of...

Wednesday, May 13, 2020

New Application Note - Isolating EVs From Urine Using qEV

Are you working with urine-derived EVs? Read our latest application note to learn how qEV SEC columns are a robust and standardised technique for purifying EVs from urine samples.

Monday, May 11, 2020

AFM Electrical characterization for your Agilent 5100/ 5500/ Multimode, AFM/STM bases

Galaxy Dual AFM Controller

With ResiScope AFM mode and Galaxy Dual Controller

The Galaxy Dual Controller can incorporate ResiScope mode, the unique AFM mode able to measure AFM...

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