Tall-Tip Probes - TAP-TALL

The TAP-TALL are specially designed 65 μm tall tip probes for profiling high aspect ratio features and deep trenches. Standard probes are only suitable for 10-15 μm features.

Technical Features

Tip Specifications
MaterialTetrahedral
Heigth (μm)65
ROC (nm)>15
CoatingAvailable uncoated or Coated with AI