Your Research Atomic Force Microscope
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The Nano-Observer is a flexible and powerful STM/AFM Microscope. Designed with the ultimate technologies, it combines performance and ease of use. The USB controller offers a real integrated lock-in for better measurement capability (phase detection, Piezo-Response Mode...).
A low-noise laser and a pre-alignment system provide simplicity and high resolution on a compact AFM head. Its intuitive software simplifies all AFM settings to allow quick and safe AFM acquisitions.
Compact and robust, the Nano-Observer fulfills the requirements for advanced users or beginners. It avoids laser alignment with the pre-positioned tip system. A top and side view of the tip/sample, combined with vertical motorized control, makes the pre-approach easy. Easy positioning can be done by combining the optical access with the X-Y translation stage.
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05/04/2017
Technical Features
XY Scan range | 100µm (tolerance +/- 10%) |
Z range | 9µm ( tolerance +/- 10%) |
XY drive resolution | 24 bit control - 0.06 Angströms |
Z drive resolution | 24 bit control – 0.006 Angströms |
Z noise level | <0.05nm RMS |
Reduced coherence laser | Wavelenght 658 nm – power < 1mW |
Color optical view system | Top and side view |
6 DAC Outputs | 6 D/A Converters – 24 bit |
8 ADC Inputs | 8 A/D Converters – 16 bit |
Data points | Up to 4096 |
Integrated Lock-in (Oscillating mode & phase) | Up to 5 MHz |
Interface | USB 2.0 |
Controller size - weight | 8 cm x 20 cm x 26 cm - 2 kg |
Power | AC 100 – 240 V 47-63 Hz |
Operating System | Windows XP (SP3 & Framework.NET 3.5 SP1) or Windows 7 (32/64bit) |