Silicon Tapping Mode Probes ACT Series

ACT Series Probes are designed for non-contact, tapping, and close contact mode applications in air and fluid. ACT probes have a high frequency that allows faster scanning. These probes are available with and without Al coating on the reflex side.

Technical Features

Cantilever ParameterNominal Value
Spring Constant (N/m)40
Frequency (kHz)300
Length (μm)125
Width (μm)35
Thickness (μm)4.5