Sample for characterization of tip shape with hard sharp pyramidal nanostructures. The structures are covered by a highly wear-resistant layer.
The exact shape of the scanning probe tip is very important for obtaining AFM images of high quality and accuracy. As new AFM tips with nanometer radii of curvature become widespread, periodic structures that have surface features of similar or greater sharpness should be used to estimate the parameters of the tip.
Technical Features
Part number .........................................PA01
Pyramid base .........................................50 - 100 nm
Pyramid height ......................................... 50 - 150 nm
Smallest edge radii ......................................... < 5 nm
Active area .........................................5 x 5 mm
Chip dimensions ......................................... 5 x 5 x 0.3 mm