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31 July 2019 - Sensofar Webinar: Optical Metrology Solutions for Semiconductor & Microelectronics
Join us as we share insight and expert advice on key topics facing the critical optical dimensional measurement and material analysis
This webinar will discuss specific analysis for QC in PCB applications during 1 hour. It will also cover critical dimensional measurement, roughness, and defect identification. Presenters Adam Platteis and Alberto Aguerri will show solutions pertaining to ISO 4287, ISO 25178, and how Sensofar's proprietary software quickly identifies profiles, roughness parameters, and defects for surface texture, height, and traces. The focus will be on imaging wafers, pads, step heights, bonds, and probe cards.
Sensofar solutions can be used in the R&D lab and for in-line QA/QC high-throughput environments for automatic Pass/Fail reporting. Sensofar offers standalone and customizable solutions that integrate confocal, interferometry, and focus variation technologies into a single sensor-head for the semiconductor and microelectronic industries.
Wed, Jul 31, 2019 5:00 PM - 6:00 PM
This webinar is for R&D managers, lab technicians, QA and QC professionals, inspection managers, engineers, process integrators, wafer technicians, as well as anyone involved in failure analysis and/or material analysis. Professionals working in the semiconductor and microelectronics fields will benefit from this webinar, as well as those involved in precision optics, data storage, display technologies, and film and material technologies.
Please join us in this interesting session!
Wed, Jul 31, 2019 5:00 PM - 6:00 PM
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